Thin Section Microscophy

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Guide
to
Thin Section Microscopy
Michael M. Raith, Peter Raase
& Jürgen Reinhardt
ISBN 978-3-00-033606-5 (PDF)
© 2011 by M.M. Raith (University of Bonn) , P. Raase (University of Kiel), J. Reinhardt
(University of KwaZulu-Natal)
All rights reserved. No part of this e-book may be reproduced, in any form or by any means,
without the prior written permission of the authors.
Mailing and E-Mail addresses:
Prof. Dr. Michael M. Raith, Roidestraße 19, 53359 Rheinbach. E-Mail: m.raith@uni-bonn.de
Dr. Peter Raase, Steendiek 1, 24220 Schönhorst. E-Mail: pr@min.uni-kiel.de
Dr. Jürgen Reinhardt, School of Geological Sciences, University of KwaZulu-Natal, Private
Bag X 54001, Durban 4000, SA. E-Mail: reinhardtj@ukzn.ac.za
Guide to Thin Section Microscopy
Contents
Contents
Preface
…………………………………………………………………………………………………………………………………..…...
I
Literature
……………………………………………………………………………………………………………………..…………..
II
Note on nomenclature and abbreviations
…………………………………………………………………………….
III
1. 1 The petrographic microscope:
1.1 Magnifying glass (loupe) and microscope
1.1.1 Imaging by a converging lens (objective)
.…....…………….................................. ……..
1-2
1.1.2 Magnification with the loupe (ocular, eyepiece)
………........................................ ……..
3
1.1.3 The compound microscope
.…....…………….................................. ………………………… ….
3-6
1.2 Objectives and oculars
1.2.1 Objective
……………………………………….………….……………………………………………….
6-8
1.2.2 Ocular
……………………………………….………….…………………………………………...……….
8-9
1.2.3 Tube, objective and ocular
………………….…………………………………………...………. .
10
1.3 Illumination
1.3.1 Aperture of illumination
...............................................................................................................
10-11
1.3.2 Light field…………..
.............................................................................................................................
11
1.3.1 Glass diffusers and filters
..........................................................................................................
11-13
1.4 Light paths in the microscope
1.4.1 Köhler illumination
………..…………................................................…………....................................
14
1.4.2 Orthoscopic mode
………..…………................................................………….......................................
14
1.4.3 Conoscopic mode
………..…………................................................…………....................................
15
1.5 Centring the microsope
…………….…………………………………………......................................
15-18
1.6 Polarizer and analyzer
……………………….…………………………………………………………..
18-20
1.7 Trouble-shooting
1.7.1 Optimising the image of the specimen
……………………………................................
20-21
1.7.2 Eliminating poor illumination
………………………………………………................................
21
1.7.3 Sources of errors in the crossed-polarizers mode
…………………................................
22
2. Measuring angles, lengths and thicknesses:
2.1 Measurement of angles
………….......................................................................................................... …
23-24
2.2 Measurement of lengths
………………………………………………………………………………..
25-26
2.3 Determination of thin section thickness
………………………………………………………
27-29
Guide to Thin Section Microscopy
Contents
3. Morphological properties:
3.1 Grain shape and symmetry
…………………………………………………………………………….
30-38
3.2 Cleavage and fracture
..........................................................................................................................................
39
3.3 Twinning
………..................................................................................................................................................
40-43
3.4 Inclusions, intergrowths, alteration products
………………………………………………..
44-48
4. Optical properties:
4.1 Some basic principles
4.1.1 Nature of light, refraction
…………………………………………………………………....
49-51
4.1.2 Isotropy and anisotropy
..............................................................................................................
52-56
4.2 Optical characteristics used for mineral determination
4.2.1 Colour and pleochroism
..............................................................................................................
57-65
4.2.2 Light refraction (relief, chagrin, Becke line)
.............................................................
66-68
4.2.3 Double refraction (extinction behaviour, interference colour)
....................
69-79
4.2.4 Extinction positions in birefringent crystal sections
………………………...
80-91
4.2.5 Conoscopic methods (optical character)
……………………......................................
92-106
5. Routine mineral determination
...................................................................................................................................
107
Guide to Thin Section Microscopy
Preface
Preface
The microscopic investigation of materials such as minerals, rocks, ores, technical and other
synthetic products in transmitted and reflected light remains one of the classic, and to this day
indispensable, mineralogical methods of analysis. Polarized-light microscopy provides a non-
destructive way to identify solid substances (whether crystalline or amorphous) with
relatively high spatial resolution, while the phases can be studied within their textural
framework. It allows an estimate of chemical compositions and provides clues to the history
of formation of the material, using specific textural characteristics (structure, fabric, phase
assemblage, phase relationships, reaction textures). Thus, in many respects polarized-light
microscopy has distinct advantages over bulk-analytical methods that use sample powders for
phase identification (XRD) or for the analysis of chemical composition (XRF, AAS). The
limitations of polarized-light microscopy are obvious where the chemical composition of
complex solid solutions has to be determined, or where the material is too fine-grained to
allow the identification of single phases. Depending on the specific objectives and the nature
of the material to be investigated, a modern study in material science will therefore aim to
combine polarized-light microscopy with complementary non-destructive methods of high
spatial resolution (EMPA, SEM-EDX, TEM).
There are numerous textbooks that provide detailed accounts of the determinative techniques
of polarized-light microscopy as well as the crystal-optical background for examining
transparent amorphous and crystalline phases (glasses, minerals, synthetic substances).
Hence, there is no need for a comprehensive presentation of that material in the following
introduction to mineral determination in thin section. For practical work at the polarized-light
microscope it is sufficient to summarise the necessary facts such that even users without an
in-depth knowledge of mineralogy can follow the instructions. Fundamentals of crystal optics
and crystallography are included only where they are crucial for explaining the observed
optical phenomena and the morphological properties of crystals.
The identification of minerals under the polarized-light microscope is based on optical and
morphological properties. Books that contain extensive listings of such properties provide the
data basis for the vast number of natural minerals and synthetic phases (see reference list).
This guide is based on a previously published text that has been widely used in the German-
speaking world, but is now out of print: “Methoden der Dünnschliffmikroskopie” by G.
Müller and M. Raith (Clausthaler Tektonische Hefte, vol.14). We adopted this text to a large
degree, revising the figures using modern graphics software, and adding many more figures
and photomicrographs to illustrate the various phenomena described in the text.
We hope that this guide will provide students with the necessary basics to master and
successfully apply polarized-light microscopy.
Suggestions are always welcome!
January 2011 Michael M. Raith, Peter Raase & Jürgen Reinhardt
I
Guide to Thin Section Microscopy
Literature
Literature
Optical crystallography and techniques in mineralogical and petrographic microscopy
Bloss, F.D. (1999): Optical Crystallography. Mineralogical Society of
America,
Washington, D.C. 239 p.
Dyar M.D., Gunter, M.E. & Tasa, D. (2008): Mineralogy and Optical Mineralogy.
Mineralogical Society of America, Chantilly, Va. 708 p.
Ehlers, E.G. (1987): Optical Mineralogy, Vol. 1. Theory and Technique. Blackwell
Scientific Publ., Palo Alto. 158 p.
Nesse, W.D. (2003): Introduction to Optical Mineralogy (3rd ed.). Oxford University Press,
New York. 348 p.
Phillips, W.R. (1971): Mineral Optics – Principles and Techniques. Freeman and Company,
San Francisco. 249 p.
Stoiber, R.E. & Morse, S.A. (1994): Crystal identification with the Polarizing Microscope.
Chapman & Hall. 358 p.
Wahlstrom, E.E. (1979): Optical Crystallography (5th ed.). John Wiley & Sons, New York.
488 p.
Mineral determination
Deer, W.A., Howie, R.A. & Zussman, J. (1992): An Introduction to the Rock-Forming
Minerals (2nd edition). Longman, London. 696 p. *
Ehlers, E.G. (1987): Optical Mineralogy, Vol. 2. Mineral Descriptions. Blackwell Scientific
Publ., Palo Alto. 286 p. *
Heinrich, E.W. (1965): Microscopic Identification of Minerals. McGraw-Hill, New York.
414 p. *
Kerr, P.F. (1977): Optical Mineralogy (4th ed.). McGraw-Hill, New York. 492 p. *
MacKenzie, W.S. & Adams, A.E. (1994): A Colour Atlas of Rocks and Minerals in Thin
Section. Manson Publ. 192 p.
MacKenzie, W.S. & Guilford, C. (1980): Atlas of Rock-Forming Minerals in Thin Section.
Longman, London. 98 p.
Nesse, W.D. (2003): Introduction to Optical Mineralogy (3rd ed.). Oxford University Press,
New York. 348 p. *
Perkins, D. & Henke, K.R. (2003): Minerals in Thin Section (2nd ed.). Prentice Hall, Upper
Saddle River. 176 p. *
Phillips, W.R. & Griffen, D.T. (1981): Optical Mineralogy. The Nonopaque Minerals. W.H.
Freeman, San Francisco. 677 p. *
Tröger, W.E., Bambauer, H.U., Taborszky, F. & Trochim, H.D. (1979): Optical
Determination of Rock-Forming Minerals. Part 1: Determinative Tables.
Schweizerbart,
Stuttgart. 188 p. *
* books with more or less extensive mineral data compilations
II
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